Dr. Sang-il Park

Dr. Sang-il Park obtained a B.S. in Physics from Seoul National University in 1981 and a Ph.D. from Stanford University in 1987. He has also a Mini MBA from the Stanford-AEA Executive Institute.

Dr. Park research interests are nanotechnology, nanometrology, and scanning probe microscopy and its applications.

Dr. Park received the Young Engineer Award by the National Academy of Engineering of Korea in 2007, Peter Drucker Innovation Award by the Peter Drucker Society in 2009, and Korea's Top 10 New Innovation Award by the Ministry of Knowledge Economy in 2010.

Sang-il Park is the CEO of Park Systems Corporation - a leading provider of atomic force microscope (AFM) solutions.

Presentation

Will the Success Story of Korea be Continued? - New challenges and the needs for global cooperation

Korea achieved successful industrialization and remarkable economic growth over the last 50 years from the ashes of the Korean War. However, Korea’s growth model, catching up with the developed countries by ‘copying’ their products with cost-saving and high efficiency manufacturing, is no longer applicable after it became the home of many world class industries. Now, Korea is facing new challenges as they open new paths in the uncharted territories. Most Korean industries are having hard time to meet the level of technical difficulty and product complexity in today’s competitive global market, especially since they are not familiar with creating, not to mention developing, something ‘new’. Therefore, global cooperation in basic research, product development, and other applications is vital to the sustainable future growth of Korea.

In this session, we will examine the policies of Korean government to support and promote global cooperation, and a specific case of Park Systems, world class scientific instrument company, developing and manufacturing Atomic Force Microscopes (AFM). Park Systems has successfully and globally commercialized AFM, the primary tool in developing the nanotechnology, including 3D-AFM for nano-scale metrology and Scanning Ion Conductance Microscope (SICM) for nano-bio applications.